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News
Dynamic Memory Solutions Reveals Next-Generation Unit Test Platform For Embedded Systems EnvironmentNorth Haven, Conn – January 27, 2010 – Dynamic Memory Solutions, leading developers of C/C++ software testing tools, today announced the development of customizable, integrated C/C++ solutions for Linux-based embedded systems. Software developers embracing embedded systems for hardware reliability need to manage and optimize software in terms of how it uses systems resources, CPU and memory. As software components in embedded systems continue to become increasingly critical, the attention to quality in embedded software increases across the board. To address this issue, Dynamic Memory Solutions provides customers with Leak Check and Code Coverage to manage these resources. These solutions assist development teams and improve software quality, while providing a more robust experience for their customer’s user base throughout the lifecycle of the software application. “Dynamic Memory Solutions new C/C++ test provides embedded development teams with a reliable solution in terms of automated, flexible and full adoptable unit testing as a necessary element in their software development process, “ states Richard Harper, Chief Operating Officer of Dynamic Memory Solutions.
About Dynamic Memory Solutions
# # # For More Information Contact:
01.27.10 Dynamic Next-Generation Unit Test Platform For Embedded Systems Environment 09.28.09 Dynamic Leak Check 2.0 announcement 02.18.08 Leak Check for HP-UX 32-bit & 64-bit Released
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271 Kings Highway / North Haven, CT 06473 / (877)-293-4144 |
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